nvestigation of Properties of Rare- Earth Elements Oxides as Gate Dielectric

The zirconium-doped lanthanum oxide nanocrystallites were prepared by a sol-gel method. In this work، the specified amounts of lanthanum nitrate hexahydrate، zirconium propoxide، acetic acid and 2-methoxy ethanol were dissolved and the obtained nanocrystallites were characterized by X-Ray Diffraction (XRD)، Transmission Electron Microscopy (TEM)، Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) techniques. For measuring dielectric constant and electrical properties، tablets of zirconium-doped lanthanum oxide nanocrystallites were made and to study the optical properties of UV-Vis spectra were used. An optical band-gap of 3. 92 eV has been measured from the transmittance spectroscopy experiments when the quantity of Zr in the oxide nanocrystallites has been 50% with annealing temperature 700 °C. The obtained size of nanoparticles by using X-powder is about 30 nm. Investigation was revealed that with doped zirconium occurs a surface structure homogeneous that leading to reducing leakage current.