Fault Tolerant QCA Inverter Gate in Harsh Environment

The state of micro or nano-scale digital circuits will be suddenly changed in case of a charged particle collision and this leads to disturbances in the operation of the circuit and the circuit will fail. These particles in electrical harsh environments can induce different effects on the circuit which these effects may be temporary or permanent in terms of performance and type of circuit and the sensitivity of the circuit to charged particles will be increased by decreasing the dimensions of the circuit. Today the nano circuits are immunized against single events with specific technologies during design and implementation of these circuits. Due to a dramatic reduction in power consumption and circuit size, Quantum cellular automata have occupied a special place in nanoelectronic and utilizing the fault tolerance methods can improve the tolerability of these circuits in harsh environments. In this paper, we present a new method to increase the fault tolerance of QCA circuits and simulation of this method for the inverter logic gate in quantum cellular automata technology.