Response of Common Bean Genotypes to Two-Spotted Spider Mite (Tetranychus urticae Koch) in Greenhouse and Field

Two-spotted spider mite is one of the most important pests of common bean that causes significant losses on bean yield. Use of resistant cultivar is the most economical and effective way to control this mite. To study response of the adult plants of common bean to Tetranychus urticae, forty genotypes were planted in RCBD with three replications under free and mite infestation conditions in field. Moreover, to study the response of the seedlings, twenty three genotypes were also planted in RCBD with three replications and four observations under mite infestation condition in greenhouse. Analysis of variance for damage score and number of mite on upper and lower leaf surfaces in mite infestation conditions in greenhouse and field experiments and for yield and its components under both conditions in field experiment showed significant differences among genotypes. According to damage score and number of mite on leaves, genotypes Black-1170 and Black-1115 were recognized as the most resistant, and KS31167 as the most susceptible genotypes