جستجوی مقالات مرتبط با کلیدواژه "afm" در نشریات گروه "فیزیک"

The morphological and structural properties of NiO films have been studied to find out the possibility of exploit (exploiting) it as a gas sensor. The thin film of the nickel oxide has been obtained by a chemical spray pyrolysis technique on glass substrates using various concentrations of nickel nitrate hexahydrate [Ni(NO3)2:6H2O] aqueous solution. The produced films were characterized using X-Ray diffraction and atomic force microscopy. The investigations revealed that the crystal structure are a cubic polycrystalline with preferential orientation along the (111) plane. The topographical analyse (AFM) shows that the values of the grain size increasing with increase the concentration, where average of the grain diameter raised from 42.04-110.058 nm of 0.01 M  and  0.1M concentrations respectively. The gas sensing results demonstrate that sensitivity of nickel  oxide semiconductor films to the hydrogen sulfide gas are affected by the size of the growing crystallites and the operating temperature.

In this paper, Al films were deposited on glass and steel substrates by using thermal evaporation technique. X-ray diffraction (XRD) analysis was used for structural characterization of Al thin films. It was found that the growth process mechanism of Al film on two substrates was different. The difference in the growth mechanism and microstructures affects the surface properties. Atomic force microscope (AFM) and field emission scanning electron microscope (FESEM) have been used to describe the surface morphology and fractal properties of Al films. The fractal properties obtained by autocorrelation function (ACF), height-height correlation function (H(r)) and Minkowski function are described and compared with each other. The results of 2D AFM images show that the Al film on the steel substrate has higher surface roughness, roughness exponent, and lateral correlation length compared to the glass substrate. However, the Al film on the glass substrate has a higher spatial complexity with a fractal dimension of Df = 2.88.

To the best of our knowledge, it is for the first time thatTERS system in near-infrared (NIR) spectrum isreporting. The current study proposed a most favorableatomic force microscopy (AFM) tip based on anincorporated optimal grating structure close to the tipapex. The optimized M2 factor and the best spatialresolution are obtained as 5.9× 109 and 8.5 nmrespectively in the NIR range of radiation light. Theresults show that the optimized grating can effectivelyincrease the amount of intensity of electric field andimprove spatial resolution within the nanoslit between theAFM tip and substrate. The detection sensitivity ofmaterials can be done by our proposed AFM-TERSsystem. The difference between the maximumenhancement factors that are correlated to several undertest sample molecules show the selectivity potential ofthe proposed AFM-TERS system in material detectiontopic.