Effect of potential on composition and depth profiles of passive films formed on 316L in 0.05M sulfuric acid

In this study, effect of potential on composition and depth profiles of passive films formed on 316L stainless steel in 0.05 M sulfuric acid has been examined using X-ray photoelectron spectroscopy (XPS). For passive film formation within the passive region, four potentials -0.2, 0.2, 0.5, and 0.8 VSCE were chosen and films were gown at each potential for 60 min. XPS analysis results showed that atomic concentration of Cr and Fe initially increase (E < 0.5 VSCE) and then decrease with potential. This decrease is due to surface dissolution of the Fe and Cr oxides. For both alloying elements, Ni and Mo, no obvious change in atomic concentration was showed. Results indicated that at higher potentials, before entering transpassive region, oxidation of Cr3+ to Cr6+ is happened.