Impact of the CNT Parameter Variations on Performance of Digital Circuits Based on CNTFET

In this paper we propose a method to study the impact of the CNT parameter variations on performance of CNTFET digital circuits. In particular we consider CNT parameters that fully identify the geometrical properties of a regular CNT, which are the length and structural indices (n, m) of CNT. We analyse in particular the effects on NAND gate using a N and P type CNTFET, polarizing at a fixed voltage and varying the CNT parameters.  As regards the indices, we limit the analysis to zig-zag CNT, highlighting that the proposed procedure can be applied to other types of CNT.