فهرست مطالب

دانش آزمایشگاهی ایران - سال چهارم شماره 2 (پیاپی 14، تابستان 1395)

مجله دانش آزمایشگاهی ایران
سال چهارم شماره 2 (پیاپی 14، تابستان 1395)

  • 36 صفحه،
  • تاریخ انتشار: 1395/06/20
  • تعداد عناوین: 7
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  • Maryam Yousefi, Marzieh Rezaei, Mahmoud Naderi Page 5

    LC/MS is suitable technique for many applications, from pharmaceutical development to environmental analysis. The ability to detect a wide range of compounds has made this technique popular with scientists in a variety of fields. The application field of LC/MS is extremely large and is covered by a wide range of instruments and techniques. To give a full list with the applications of LC/MS is simply impossible; its flexibility makes it attractive in a lot of different fields. Some interesting applications are listed in this manuscript.

    Keywords: Liquid Chromatography-Mass Spectroscopy(LC-MS), detectors, application
  • Parvin Hadian, Seyed Mostafa Mir Hosseini Sar Jam, Elahe Motaee Page 12

    Atomic force microscopy (AFM) as a powerful tool has been developed for characterization of surfaces and materials in nanoscale. The Raman Effect (inelastic light scattering) provides extensive information about sample chemical composition, quality of crystal structure, crystal orientation, presence of impurities and defects, and so on. The couple of AFM and Raman is the latest trend in hybrid imaging/chemical analysis instrumentation. Nowadays, AFM/Raman is seen as a valuable tool for biologists, chemists, pharmaceutical companies, designers of new materials, especially in nanotechnology to coordinate chemical information with physical properties such as phase distribution, electrical, mechanical, or magnetic information.

    Keywords: Diffraction limit, Raman scattering, Field enhancement, Surface plasmons, Atomic force microscopy
  • Maryam Khaninour, Behnaz Kaveh, Roghayeh Zabihi Page 19

    Obtained information is from X-rays by energy or wavelength of them, according to that two type of X-ray detection system will be: EDS system as the energy dispersive spectrometer and the WDS system as the wavelength dispersive spectrometer.EDS systems often use different types of semiconductor detectors, such as Si (Li), HPGe and SDD, on the other hand detectors used in WDX usually are gas detectors such as proportional counters or scintillation detectors. Although the performance of the detectors and X-ray detection is quite different, but the ultimate goal in both types of spectroscopy is detection energy or wavelength of characteristic X-ray emitted and elemental analysis in the desire sample in scanning electron microscopy.

    Keywords: Scanning electron microscope, Energy DispersiveSpectroscopy, Wavelength DispersiveSpectroscopy, Semiconductor Detector, GasDetector, Scintillation Detector
  • Payam Azadi, Ahamad Zahir Mirdamadi Page 24

    ILAC is the international organization for accreditation bodies operating in accordance with ISO/IEC 17011 and involved in the accreditation of conformity assessment bodies including calibration laboratories (using ISO/IEC 17025), testing laboratories (using ISO/IEC 17025), medical testing laboratories (using ISO 15189) and inspection bodies (using ISO/IEC 17020). Accreditation is the independent evaluation of conformity assessment bodies against recognized standards to carry out specific activities to ensure their impartiality and competence. In this paper, we introduce the ILAC and its procedures.

    Keywords: ILAC, MRA, Accreditation, Laboratory, Standardization, Regional Cooperation, Inspection